Berger, Toni and Mergenthaler, Matthias and de Kruijf, Mathieu and Geyer, Simon and Braakman, Floris and Warburton, Richard J. and Kuhlmann, Andreas V.. (2023) A compact and versatile cryogenic probe station for quantum device testing. Review of Scientific Instruments, 94 (5). 054707 .
|
PDF
- Accepted Version
36Mb |
Official URL: https://edoc.unibas.ch/96335/
Downloads: Statistics Overview
Abstract
Fast feedback from cryogenic electrical characterization measurements is key for the development of scalable quantum computing technology. At room temperature, high-throughput device testing is accomplished with a probe-based solution, where electrical probes are repeatedly positioned onto devices for acquiring statistical data. In this work, we present a probe station that can be operated from room temperature down to below 2 K. Its small size makes it compatible with standard cryogenic measurement setups with a magnet. A large variety of electronic devices can be tested. Here, we demonstrate the performance of the prober by characterizing silicon fin field-effect transistors as a host for
quantum dot spin qubits. Such a tool can massively accelerate the design–fabrication–measurement cycle and provide important feedback for process optimization toward building scalable quantum circuits.
quantum dot spin qubits. Such a tool can massively accelerate the design–fabrication–measurement cycle and provide important feedback for process optimization toward building scalable quantum circuits.
Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Experimental Physics (Warburton) |
---|---|
UniBasel Contributors: | Warburton, Richard J |
Item Type: | Article |
Article Subtype: | Research Article |
Publisher: | American Institute of Physics |
ISSN: | 0034-6748 |
Language: | English |
Identification Number: |
|
edoc DOI: | |
Last Modified: | 25 Apr 2024 13:37 |
Deposited On: | 25 Apr 2024 13:37 |
Repository Staff Only: item control page