Items where Author is "Heinzelmann, H."

Article

Eng, L. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Bennewitz, R. and Luthi, R. and Meyer, E. and Huser, T. and Heinzelmann, H. and Guntherodt, H. J.. (1999) Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics, Vol. 222, H. 1-4. pp. 411-420.

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Overney, R. and Howald, L. and HUG, H. and Jung, T. and Hidber, H. R. and Guntherodt, H. J.. (1991) Atomic resolution on the surface of LiF(100) by atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 9, H. 2, Part 2. pp. 1329-1332.

Meyer, E. and Howald, L. and Overney, R. M. and Heinzelmann, H. and Frommer, J. and Guntherodt, H. J. and Wagner, T. and Schier, H. and Roth, S.. (1991) Molecular-resolution images of Langmuir-Blodgett films using atomic force microscopy. Nature, Vol. 349, H. 6308. pp. 398-400.

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Howald, L. and Guntherodt, H. J.. (1990) Atomic force microscopy : high-resolution and contrast mechanism. Helvetica physica acta, Vol. 63, H. 6. pp. 793-794.

Meyer, E. and Heinzelmann, H. and Rudin, H. and Guntherodt, H. J.. (1990) Atomic resolution on LiF (001) by atomic force microscopy. Zeitschrift für Physik. B, Condensed matter, Vol. 79, H. 1. pp. 3-4.

Heinzelmann, H. and Meyer, E. and Guntherodt, H. J. and Steiger, R.. (1989) Local step structure of the AgBr(100) and (111) surfaces studied by atomic force microscopy. Surface science, Vol. 221, H. 1-2. pp. 1-10.

Grutter, P. and Meyer, E. and Heinzelmann, H. and Rosenthaler, L. and Hidber, H. R. and Guntherodt, H. J.. (1988) Application of atomic force microscopy to magnetic materials. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. pp. 279-282.

Heinzelmann, H. and Meyer, E. and Grutter, P. and Hidber, H. R. and Rosenthaler, L. and Guntherodt, H. J.. (1988) Atomic force microscopy : general aspects and application to insulators. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. pp. 275-278.

Heinzelmann, H. and Grutter, P. and Meyer, E. and Hidber, H. and Rosenthaler, L. and Ringger, M. and Guntherodt, H. J.. (1987) Design of an atomic force microscope and first results. Surface science, Vol. 189. pp. 29-35.