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Items where Author is "Sigg, Hans"

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Group by: Date | Item Type | Refereed
Jump to: 2019
Number of items: 1.

2019

Woerle, Judith and Johnson, Brett C. and Bongiorno, Corrado and Yamasue, Kohei and Ferro, Gabriel and Dutta, Dipanwita and Jung, Thomas A. and Sigg, Hans and Cho, Yasuo and Grossner, Ulrike and Camarda, Massimo. (2019) Two-dimensional defect mapping of the SiO2/4H-SiC interface. Physical Review Materials , 3 (8). 084602.

This list was generated on Thu Mar 28 19:36:49 2024 CET.