Items where Author is "Grutter, P."
Jump to: Article Number of items: 4. ArticlePfeiffer, O. and Bennewitz, R. and Baratoff, A. and Meyer, E. and Grutter, P.. (2002) Lateral-force measurements in dynamic force microscopy. Physical Review B, Vol. 65, H. 16 , 0161403, 4 S.. Grutter, P. and Meyer, E. and Heinzelmann, H. and Rosenthaler, L. and Hidber, H. R. and Guntherodt, H. J.. (1988) Application of atomic force microscopy to magnetic materials. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. pp. 279-282. Heinzelmann, H. and Meyer, E. and Grutter, P. and Hidber, H. R. and Rosenthaler, L. and Guntherodt, H. J.. (1988) Atomic force microscopy : general aspects and application to insulators. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. pp. 275-278. Heinzelmann, H. and Grutter, P. and Meyer, E. and Hidber, H. and Rosenthaler, L. and Ringger, M. and Guntherodt, H. J.. (1987) Design of an atomic force microscope and first results. Surface science, Vol. 189. pp. 29-35. |
