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Woerle, Judith and Johnson, Brett C. and Bongiorno, Corrado and Yamasue, Kohei and Ferro, Gabriel and Dutta, Dipanwita and Jung, Thomas A. and Sigg, Hans and Cho, Yasuo and Grossner, Ulrike and Camarda, Massimo. (2019) Two-dimensional defect mapping of the SiO2/4H-SiC interface. Physical Review Materials , 3 (8). 084602.

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