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Bartolf, H. and Gysin, U. and Glatzel, T. and Rossmann, H. R. and Jung, T. A. and Reshanov, S. A. and Schöner, A. and Meyer, E.. (2015) Improving the Design of the Shield for the Electric Field in SiC-Based Schottky-Rectifiers and Ion-Implantation Cascades by SPM Dopant-Imaging. Microelectronic Engineering, 148. pp. 1-4.

Bartolf, H. and Gysin, U. and Rossmann, H. R. and Bubendorf, A. and Glatzel, T. and Jung, T. A. and Meyer, E. and Zimmermann, M. and Reshanov, S. and Schöner, A.. (2015) Development of power semiconductors by quantitative nanoscale dopant imaging. In: 2015 IEEE 27th International Symposium on Power Semiconductor Devices IC`s (ISPSD). pp. 281-284.

Gysin, Urs and Glatzel, Thilo and Schmölzer, Thomas and Schöner, Adolf and Reshanov, Sergey and Bartolf, Holger and Meyer, Ernst. (2015) Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices. Beilstein Journal of Nanotechnology, 6. pp. 2485-2497.

Rossmann, H. R. and Gysin, Urs and Bubendorf, Alexander and Glatzel, Thilo and Reshanov, Sergey and Schöner, Adolf and Jung, T. A. and Meyer, Ernst and Bartolf, Holger. (2015) Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers. Materials Science Forum, 821-823. pp. 269-272.

Fessler, Gregor and Eren, Baran and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst. (2014) Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene. Applied physics letters, 104 (4). 041910.

Eren, Baran and Glatzel, Thilo and Kisiel, Marcin and Fu, Wangyang and Pawlak, Rémy and Gysin, Urs and Nef, Cornelia and Marot, Laurent and Calame, Michel and Schönenberger, Christian and Meyer, Ernst. (2013) Hydrogen plasma microlithography of graphene supported on a Si/SiO2 substrate. Applied physics letters, 102 (7). 071602.