Lang, H. P. and Frey, T. and Güntherodt, H. -J.. (1991) Atomic Resolution and Nanostructure of YBa2Cu3O7-δ Laser-Ablated Thin Films Studied by Scanning Tunnelling Microscopy (STM). Europhysics letters, 15 (6). pp. 667-670.
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Official URL: https://edoc.unibas.ch/94698/
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Abstract
Scanning tunnelling microscopy (STM) is applied to investigate the surface structure of high-quality c-axis oriented laser-ablated thin YBa2Cu3O7-delta-films. The main features of the surface are steps of one-unit cell height documenting the two-dimensional growth process of the epitaxial film. For the first time atomic resolution with STM is achieved, indicating a 3.8 angstrom square lattice on YBa2Cu3O7-delta-laser-ablated films, as expected from diffraction techniques. Screw dislocations and holes of different sizes are the most frequently observed types of lattice defects in these films.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Former Organization Units Physics > Experimentelle Physik (Güntherodt) 05 Faculty of Science > Departement Physik > Physik 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
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| UniBasel Contributors: | Lang, Hans Peter |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | IOP Publishing |
| ISSN: | 0295-5075 |
| e-ISSN: | 1286-4854 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: | |
| Last Modified: | 24 May 2023 09:30 |
| Deposited On: | 24 May 2023 09:30 |
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