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Atomic Resolution and Nanostructure of YBa2Cu3O7-δ Laser-Ablated Thin Films Studied by Scanning Tunnelling Microscopy (STM)

Lang, H. P. and Frey, T. and Güntherodt, H. -J.. (1991) Atomic Resolution and Nanostructure of YBa2Cu3O7-δ Laser-Ablated Thin Films Studied by Scanning Tunnelling Microscopy (STM). Europhysics letters, 15 (6). pp. 667-670.

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Official URL: https://edoc.unibas.ch/94698/

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Abstract

Scanning tunnelling microscopy (STM) is applied to investigate the surface structure of high-quality c-axis oriented laser-ablated thin YBa2Cu3O7-delta-films. The main features of the surface are steps of one-unit cell height documenting the two-dimensional growth process of the epitaxial film. For the first time atomic resolution with STM is achieved, indicating a 3.8 angstrom square lattice on YBa2Cu3O7-delta-laser-ablated films, as expected from diffraction techniques. Screw dislocations and holes of different sizes are the most frequently observed types of lattice defects in these films.
Faculties and Departments:05 Faculty of Science > Departement Physik > Former Organization Units Physics > Experimentelle Physik (Güntherodt)
05 Faculty of Science > Departement Physik > Physik
05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Lang, Hans Peter
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:IOP Publishing
ISSN:0295-5075
e-ISSN:1286-4854
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:24 May 2023 09:30
Deposited On:24 May 2023 09:30

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