Nanowire Magnetic Force Sensors Fabricated by Focused-Electron-Beam-Induced Deposition

Mattiat, H. and Rossi, N. and Gross, B. and Pablo-Navarro, J. and Magen, C. and Badea, R. and Berezovsky, J. and De Teresa, J. M. and Poggio, M.. (2020) Nanowire Magnetic Force Sensors Fabricated by Focused-Electron-Beam-Induced Deposition. Physical review applied, 13 (4). 044043.

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We demonstrate the use of individual magnetic nanowires (NWs), grown by focused-electron-beaminduced deposition (FEBID), as scanning magnetic force sensors. Measurements of their mechanical susceptibility, thermal motion, and magnetic response show that these NWs possess high-quality flexural mechanical modes and a strong remanent magnetization pointing along their long axis. Together, these properties make the NWs excellent sensors of weak magnetic field patterns, as confirmed by calibration measurements on a micron-sized current-carrying wire and magnetic scanning-probe images of a permalloy disk. The flexibility of FEBID in terms of the composition, geometry, and growth location of the resulting NWs, makes it ideal for fabricating scanning probes specifically designed for imaging subtle patterns of magnetization or current density.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanotechnologie Argovia (Poggio)
UniBasel Contributors:Mattiat, Hinrich Bernhard and Rossi, Nicola and Gross, Boris André and Poggio, Martino
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Physical Society
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:12 Nov 2020 04:10
Deposited On:05 Aug 2020 14:09

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