Electrostatic interactions with dielectric samples in scanning probe microscopies

Sadeghi, Ali and Baratoff, Alexis and Goedecker, Stefan. (2013) Electrostatic interactions with dielectric samples in scanning probe microscopies. Physical review B: Condensed matter and materials physics, 88 (3). 035436.

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Official URL: https://edoc.unibas.ch/76339/

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Electrostatic interactions between the conducting tip of a scanning probe microscope and a flat conductor coated with a thin or thick dielectric layer are treated analytically and numerically. Exact and compact approximate expressions for the capacitance, force, force gradient, electric field profiles, and their effective widths are derived for a spherical model tip by generalizing known solutions for the conducting sphere and sample problem. These expressions allow convenient modeling of various measurements involving voltage-biased probes, estimation of lateral resolution, and prediction of trends as a function of relevant parameters.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Physik (Goedecker)
UniBasel Contributors:Goedecker, Stefan
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Physical Society
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:22 Apr 2020 08:10
Deposited On:22 Apr 2020 08:10

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