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Items where Author is "Hug, Hans-Josef"

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Kawai, Shigeki and Glatzel, Thilo and Hug, Hans-Josef and Meyer, Ernst. (2010) Atomic contact potential variations of Si(111)-7 * 7 analyzed by Kelvin probe force microscopy. Nanotechnology, Vol. 21, H. 24 , 245704 (9 pp.).

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