Wirtz, Tom and Fleming, Yves and Gysin, Urs and Glatzel, Thilo and Wegmann, Urs and Meyer, Ernst and Maier, Urs and Rychen, Joerg. (2013) Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis. Surface and interface analysis, Vol. 45, H. 1,. pp. 513-516.
Full text not available from this repository.
Official URL: http://edoc.unibas.ch/dok/A6223382
Downloads: Statistics Overview
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Wiley |
| ISSN: | 0142-2421 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Related URLs: | |
| Identification Number: |
|
| Last Modified: | 27 Mar 2014 13:12 |
| Deposited On: | 27 Mar 2014 13:12 |
Repository Staff Only: item control page