Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Howald, L. and Guntherodt, H. J.. (1990) Atomic force microscopy : high-resolution and contrast mechanism. Helvetica physica acta, Vol. 63, H. 6. pp. 793-794.
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Official URL: http://edoc.unibas.ch/dok/A5839532
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| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Birkhäuser |
| ISSN: | 0018-0238 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:17 |
| Deposited On: | 14 Sep 2012 06:42 |
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