Items where Author is "Riedel, Max F."

Yes

Ockeloen, Caspar F. and Schmied, Roman and Riedel, Max F. and Treutlein, Philipp. (2013) Quantum Metrology with a Scanning Probe Atom Interferometer. Physical review letters, 111 (14). p. 143001.

Riedel, Max F. and Böhi, Pascal and Li, Yun and Hänsch, Theodor W. and Sinatra, Alice and Treutlein, Philipp. (2010) Atom-chip-based generation of entanglement for quantum metrology. Nature, 464 (7292). pp. 1170-1173.

Böhi, Pascal and Riedel, Max F. and Hänsch, Theodor W. and Treutlein, Philipp. (2010) Imaging of microwave fields using ultracold atoms. Applied physics letters, 97 (5). 051101.

No

Böhi, Pascal and Riedel, Max F. and Treutlein, Philipp. (2011) Cold atoms image microwave fields. SPS Communications, Vol. 33. p. 10.