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Atomic force microscopy characterization of a YBaCuO crystal surface patterned by proton irradiation

Kroener, T. and Linker, G. and Meyer, O. and Strehlau, B. and Wolf Th., Th. and Hug, H. J. and Jung, T. A. and Güntherodt, H. -J.. (1992) Atomic force microscopy characterization of a YBaCuO crystal surface patterned by proton irradiation. Physica C: Superconductivity and its Applications, 191 (1-2). pp. 243-247.

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Official URL: https://edoc.unibas.ch/94712/

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Abstract

A YBaCuO single crystal and a c-axis grown epitaxial YBaCuO film were irradiated with 200 keV protons to study the changes of the transport and especially of the structural properties. The single crystal was covered with a special grid-mask with strips of 5-mu-m periodicity in the irradiation procedure. The changes of the structural properties of the film and of the single crystal were studied by X-ray diffraction and by interference contrast and atomic force microscopy, respectively. The main structural effect of irradiation with moderate fluences is a lattice expansion of 0.8% in the film. The expansion of the irradiated parts of the crystal was 15-20 nm which is a factor of about 2 higher than in the film. This discrepancy can be resolved by considering the different energy deposition processes in the crystal and in the film.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik
UniBasel Contributors:Jung, Thomas A.
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:Elsevier
ISSN:0921-4534
e-ISSN:1873-2143
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:12 Jun 2023 13:31
Deposited On:12 Jun 2023 13:31

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