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Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers

Forrer, L. and Kamber, A. and Knoll, A. and Poggio, M. and Braakman, F. R.. (2023) Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers. AIP Advances, 13 (3). 035208.

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanotechnologie Argovia (Poggio)
UniBasel Contributors:Poggio, Martino and Forrer, Luca and Kamber, Aurèle and Braakman, Floris
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:AIP Publishing
e-ISSN:2158-3226
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
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edoc DOI:
Last Modified:08 May 2023 12:54
Deposited On:08 May 2023 12:54

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