Forrer, L. and Kamber, A. and Knoll, A. and Poggio, M. and Braakman, F. R.. (2023) Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers. AIP Advances, 13 (3). 035208.
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Official URL: https://edoc.unibas.ch/94481/
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Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanotechnologie Argovia (Poggio) |
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UniBasel Contributors: | Poggio, Martino and Forrer, Luca and Kamber, Aurèle and Braakman, Floris |
Item Type: | Article, refereed |
Article Subtype: | Research Article |
Publisher: | AIP Publishing |
e-ISSN: | 2158-3226 |
Note: | Publication type according to Uni Basel Research Database: Journal article |
Language: | English |
Identification Number: |
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edoc DOI: | |
Last Modified: | 08 May 2023 12:54 |
Deposited On: | 08 May 2023 12:54 |
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