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Vectorial scanning force microscopy using a nanowire sensor

Rossi, Nicola and Braakman, Floris and Cadeddu, Davide and Vasyukov, Denis and Tütüncüoglu, Gözde and Fontcuberta i Morral, Anna and Poggio, Martino. (2016) Vectorial scanning force microscopy using a nanowire sensor. Nature Nanotechnology. p. 6.

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Official URL: http://edoc.unibas.ch/44719/

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Abstract

Self-assembled nanowire (NW) crystals can be grown into nearly defect-free nanomechanical resonators with exceptional properties, including small motional mass, high resonant frequency and low dissipation. Furthermore, by virtue of slight asymmetries in geometry, a NW's flexural modes are split into doublets oscillating along orthogonal axes. These characteristics make bottom-up grown NWs extremely sensitive vectorial force sensors. Here, taking advantage of its adaptability as a scanning probe, we use a single NW to image a sample surface. By monitoring the frequency shift and direction of oscillation of both modes as we scan above the surface, we construct a map of all spatial tip–sample force derivatives in the plane. Finally, we use the NW to image electric force fields distinguishing between forces arising from the NW charge and polarizability. This universally applicable technique enables a form of atomic force microscopy particularly suited to mapping the size and direction of weak tip–sample forces.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanotechnologie Argovia (Poggio)
UniBasel Contributors:Poggio, Martino and Rossi, Nicola and Braakman, Floris and Cadeddu, Davide and Vasyukov, Denis
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:Nature Publishing Group
ISSN:1748-3387
e-ISSN:1748-3395
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
Identification Number:
Last Modified:28 Sep 2018 11:33
Deposited On:02 Nov 2016 08:39

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