Wirtz, Tom and Fleming, Yves and Gerard, Mathieu and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst and Wegmann, Urs and Maier, Urs and Odriozola, Aitziber Herrero and Uehli, Daniel. (2012) Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Review of scientific instruments, Vol. 83, H. 6 , 063702.
Full text not available from this repository.
Official URL: http://edoc.unibas.ch/dok/A6083416
Downloads: Statistics Overview
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | American Institute of Physics |
| ISSN: | 0034-6748 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
|
| Last Modified: | 24 May 2013 09:22 |
| Deposited On: | 24 May 2013 09:03 |
Repository Staff Only: item control page