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Simulation and correction of electron images of tilted planar weak-phase samples

Mariani, V. and Schenk, A. D. and Philippsen, A. and Engel, A.. (2011) Simulation and correction of electron images of tilted planar weak-phase samples. Journal of structural biology, Vol. 174, H. 2. pp. 259-268.

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Official URL: http://edoc.unibas.ch/dok/A6002473

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Abstract

The phase contrast theory describes the transfer of information from a weak-phase object to the image plane of a transmission electron microscope. For a tilted sample where the distance from the focal plane varies continuously across the field of view, the recently introduced Tilted Contrast Imaging Function (TCIF) model provides the mathematical description of this information transfer. Here we expand the TCIF model to account for astigmatism, and present several methods to generate simulated images of tilted samples and compare them to experimental results. We analyze in depth the differences between TCIF and the classical Contrast Transfer Function (CTF) model, which assumes invariant defocus, and discuss how they can affect the interpretation of experimental data. In addition, we apply the TCIF model to simulated test objects in order to explore the performance of techniques that aim to correct the artifacts introduced by the imaging function, and evaluate how well they recover the original information after optimizing the parameters.
Faculties and Departments:05 Faculty of Science > Departement Biozentrum > Former Organization Units Biozentrum > Structural Biology (Engel)
UniBasel Contributors:Engel, Andreas H
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:Elsevier
ISSN:1047-8477
Note:Publication type according to Uni Basel Research Database: Journal article
Last Modified:11 Oct 2012 15:31
Deposited On:11 Oct 2012 15:15

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