Battiston, F. M. and Bammerlin, M. and Loppacher, C. and Luthi, R. and Meyer, E. and Guntherodt, H. J. and Eggimann, F.. (1998) Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope. Applied physics letters, Vol. 72, H. 1. pp. 25-27.
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Official URL: http://edoc.unibas.ch/dok/A5839464
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Abstract
A feedback mechanism based on fuzzy logic has been applied to operate a combined atomic force microscope (AFM)/scanning tunneling microscope (STM), which is able to measure the resonance frequency shift Delta f of the cantilever-type spring and the mean tunneling current >(I)over bar (t)< simultaneously. Using a decision making logic, the microscope can be scanned over a heterogeneous surface without tip crash. On the conductive parts of the sample, the STM mode is preferred, whereas the noncontact (nc)-AFM mode is used on the poorly conductive parts of the surface. The transition from the STM mode to nc-AFM mode is performed smoothly with the fuzzy logic feedback. (C) 1998 American Institute of Physics.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | American Institute of Physics |
| ISSN: | 0003-6951 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:43 |
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