Howald, L. and Luthi, R. and Meyer, E. and Gerth, G. and Haefke, H. G. and Overney, R. and Guntherodt, H. J.. (1994) Friction force microscopy on clean surfaces of NaCl, NaF, and AgBr. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2227-2230.
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Official URL: http://edoc.unibas.ch/dok/A5839493
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Abstract
With a bidirectional atomic force microscope, measurements are performed on insulating surfaces of ionic crystals, such as NaF, NaCl, and AgBr. Atomic-scale friction is observed on surfaces, and is being prepared and studied in ultrahigh vacuum, where contaminants can be excluded. Comparative measurements show the favorable frictional properties of NaCl.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | American Vacuum Society |
| ISSN: | 1071-1023 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:43 |
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