Rast, S. and Wattinger, C. and Gysin, U. and Meyer, E.. (2000) The noise of cantilevers. Nanotechnology, Vol. 11, H. 3. pp. 169-172.
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Official URL: http://edoc.unibas.ch/dok/A5262154
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Abstract
Micromechanical cantilevers used in atomic force microscopy are characterized by the geometry, the elastic modulus E and the quality factor Q. The sensor can be regarded as a rectangular bar clamped on one side and free on the other. In contrast to a simple harmonic oscillator a cantilever has different eigenfrequencies omega(n) and a mode-dependent spring constant D-n. Using the fluctuation-dissipation theorem we developed a simple model to calculate the thermal noise on each eigenmode for a free cantilever. With this result we can decide whether measuring on higher eigenmodes increases the force sensitivity.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | IOP Publ. |
| ISSN: | 0957-4484 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: | |
| Last Modified: | 22 Mar 2012 14:27 |
| Deposited On: | 22 Mar 2012 13:58 |
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