Pfeiffer, O. and Loppacher, C. and Wattinger, C. and Bammerlin, M. and Gysin, U. and Guggisberg, M. and Rast, S. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (2000) Using higher flexural modes in non-contact force microscopy. Applied surface science, Vol. 157, H. 4. pp. 337-342.
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Official URL: http://edoc.unibas.ch/dok/A5262161
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Abstract
The oscillation characteristics of higher flexural modes of a rectangular microfabricated silicon cantilever have been studied in ultra-high vacuum (UHV) for a free cantilever and for a typical situation in non-contact force microscopy. The results are discussed with respect to the use of such modes in dynamic force microscopy (DFM) and local dissipation measurements. (C) 2000 Elsevier Science B.V. All rights reserved.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | North-Holland |
| ISSN: | 0169-4332 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: | |
| Last Modified: | 22 Mar 2012 14:26 |
| Deposited On: | 22 Mar 2012 13:53 |
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