Barwich, V. and Bammerlin, M. and Baratoff, A. and Bennewitz, R. and Guggisberg, M. and Loppacher, C. and Pfeiffer, O. and Meyer, E. and Guntherodt, H. J. and Salvetat, J. P. and Bonard, J. M. and Forro, L.. (2000) Carbon nanotubes as tips in non-contact SFM. Applied surface science, Vol. 157, H. 4. pp. 269-273.
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Official URL: http://edoc.unibas.ch/dok/A5262160
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Abstract
The demand for sharp and stable tips suggests the use of carbon nanotubes as probing tips in scanning force microscopy. Here, we report a comparison of the long-range forces of conventional tips and nanotube tips, topographical images of various surfaces, such as Cu(lll), Si(111)7 X 7 and NaCl(100), as well as images of a bundle of multiwalled nanotubes, which was deposited by severe tip crashing. It is found that the long-range forces of carbon nanotube probing tips are reduced and that they are more resistant to wear than conventional silicon tips.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | North-Holland |
| ISSN: | 0169-4332 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: | |
| Last Modified: | 22 Mar 2012 14:26 |
| Deposited On: | 22 Mar 2012 13:53 |
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