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Observation of magnetic forces by the atomic force microscope

J. J. Saenz, N. Garcia and P. GrUtter, E. Meyer and H. Heinzelmann, R. Wiesendanger and L. Rosenthaler, H. R. Hidber. (1987) Observation of magnetic forces by the atomic force microscope. Journal of applied physics, Vol. 62, H. 10. S. 4293-4295.

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Official URL: http://edoc.unibas.ch/dok/A6001791

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Abstract

We  pr e s ent  a new way to observe the  surface doma in di s t r ibut ion of  a magne t i c  s ampl e  a t  a submi c rome t e r  scale. Thi s  magnetic microscopy is based on the  idea of  me a sur ing magne t i c forces wi th the  r e c ent ly developed a tomi c  force microscope (AFM) .  We  s tudy the  magne t i c forces involved in the  int e r a c t ion be twe en a single-domain mi c rot ip and the  s ampl e  sur f a c e magne t i c  doma ins .  The  influence of  the  experimental condi t ions  on the  pe r formanc e  of  the AFM a s  a magne t i c  profiling device is also discussed. Pr e l imina ry expe r iment a l  r e sul t s  a r e r epor t ed.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Bibsysno:Link to catalogue
Publisher:American Institute of Physics
ISSN:0021-8979
Note:Publication type according to Uni Basel Research Database: Journal article
Last Modified:11 Oct 2012 15:31
Deposited On:11 Oct 2012 15:21

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