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Atomic force microscopy : general aspects and application to insulators

Heinzelmann, H. and Meyer, E. and Grutter, P. and Hidber, H. R. and Rosenthaler, L. and Guntherodt, H. J.. (1988) Atomic force microscopy : general aspects and application to insulators. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. S. 275-278.

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Official URL: http://edoc.unibas.ch/dok/A5262173

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Bibsysno:Link to catalogue
Publisher:American Vacuum Society
ISSN:0734-2101
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:22 Mar 2012 14:26
Deposited On:22 Mar 2012 13:54

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