Items where Author is "Schwarz, U. D."

Yes

Schwarz, U. D. and Haefke, H. and Jung, T. and Meyer, E. and Guntherodt, H. J. and Steiger, R. and Bohonek, J.. (1992) Atomic force microscopy study of tabular AgBr microcrystals (T-grains). Journal Of Imaging Science And Technology, Vol. 36, H. 4. pp. 361-365.

Schwarz, U. D. and Bohonek, J. and Haefke, H. and Jung, T. A. and Meyer, E. and Steiger, R. and Güntherodt, H. -J.. (1992) Micro- and Nanostructures on Silver Halide Surfaces. II. Morphology of Photographic AgBr Microcrystals. Helvetica Physica Acta, 65 (6). pp. 874-875.

Haefke, H. and Burgler, D. and Gerth, G. and Howald, L. and Meyer, E. and Schwarz, U. D. and Steiger, R. and Tarrach, G. and Wiesendanger, R.. (1992) Microstructures and nanostructures on silver-halide surfaces 1 : preparation and characterization of AgBr samples. Helvetica physica acta, Vol. 65, H. 6. pp. 872-873.

Schwarz, U. D. and Bohonek, J. and Haefke, H. and Jung, T. A. and Meyer, E. and Steiger, R. and Guntherodt, H. J.. (1992) Microstructures and nanostructures on silver-halide surfaces 2 : morphology of photographic AgBr microcrystals. Helvetica physica acta, Vol. 65, H. 6. pp. 874-875.

Schwarz, U. D. and Haefke, H. and Jung, T. and Meyer, E. and Guntherodt, H. J. and Steiger, R. and Bohonek, J.. (1992) Plate-like microcrystals of silver bromide investigated by scanning force microscopy. Ultramicroscopy, Vol. 41, H. 4. pp. 435-439.

Jung, T. A. and Moser, A. and HUG, H. J. and Brodbeck, D. and Hofer, R. and Hidber, H. R. and Schwarz, U. D.. (1992) The atomic force microscope used as a powerful tool for machining surfaces. ULTRAMICROSCOPY, 42-44 (2). pp. 1446-1451.

No

Jung, T. A. and Moser, A. and Gale, Michael T. and Hug, H. J. and Schwarz, U. D.. (1993) Atomic force microscopy experimentation at surfaces: hardness, wear and lithographic applications. In: Technology of Proximal Probe Lithography. Proceedings, 10310. 103100E.

Dammer, U. and Anselmetti, D. and Dreier, M. and Frommer, J. and Funfschilling, J. and Gerth, G. and Guntherodt, H. J. and Haefke, H. and Hidber, H. R. and Howald, L. and HUG, H. J. and Jung, T. H. and Lang, H. P. and Luthi, R. and Meyer, E. and Moser, A. and Parashikov, I. and Reimann, P. and Richmond, T. and Ruetschi, M. and Rudin, H. and Schwarz, U. D. and Staufer, U. and SUM, R.. (1993) Scanning probe microscopy for industrial applications : selected examples. Scanning, Vol. 15, H. 5. pp. 257-264.