Items where Author is "Rudin, H."

1994

Howald, L. and Haefke, H. and Luthi, R. and Meyer, E. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1994) Ultrahigh-vacuum scanning force microscopy : atomic-scale resolution at monatomic cleavage steps. Physical Review B, Vol. 49, H. 8. pp. 5651-5656.

1993

Howald, L. and Meyer, E. and Luthi, R. and Haefke, H. and Overney, R. and Rudin, H. and Guntherodt, H. J.. (1993) Multifunctional probe microscope for facile operation in ultrahigh-vacuum. Applied physics letters, Vol. 63, H. 1. pp. 117-119.

Dammer, U. and Anselmetti, D. and Dreier, M. and Frommer, J. and Funfschilling, J. and Gerth, G. and Guntherodt, H. J. and Haefke, H. and Hidber, H. R. and Howald, L. and HUG, H. J. and Jung, T. H. and Lang, H. P. and Luthi, R. and Meyer, E. and Moser, A. and Parashikov, I. and Reimann, P. and Richmond, T. and Ruetschi, M. and Rudin, H. and Schwarz, U. D. and Staufer, U. and SUM, R.. (1993) Scanning probe microscopy for industrial applications : selected examples. Scanning, Vol. 15, H. 5. pp. 257-264.

1992

Howald, L. and Luthi, R. and Meyer, E. and Haefke, H. and Overney, R. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1992) Bidirectional force microscope for surface-analysis in ultrahigh-vacuum. Helvetica physica acta, Vol. 65, H. 6. pp. 868-869.

1990

Meyer, E. and Heinzelmann, H. and Rudin, H. and Guntherodt, H. J.. (1990) Atomic resolution on LiF (001) by atomic force microscopy. Zeitschrift für Physik. B, Condensed matter, Vol. 79, H. 1. pp. 3-4.