Items where Author is "Moser, A."
Number of items: 3. 1993Jung, T. A. and Moser, A. and Gale, Michael T. and Hug, H. J. and Schwarz, U. D.. (1993) Atomic force microscopy experimentation at surfaces: hardness, wear and lithographic applications. In: Technology of Proximal Probe Lithography. Proceedings, 10310. 103100E. Dammer, U. and Anselmetti, D. and Dreier, M. and Frommer, J. and Funfschilling, J. and Gerth, G. and Guntherodt, H. J. and Haefke, H. and Hidber, H. R. and Howald, L. and HUG, H. J. and Jung, T. H. and Lang, H. P. and Luthi, R. and Meyer, E. and Moser, A. and Parashikov, I. and Reimann, P. and Richmond, T. and Ruetschi, M. and Rudin, H. and Schwarz, U. D. and Staufer, U. and SUM, R.. (1993) Scanning probe microscopy for industrial applications : selected examples. Scanning, Vol. 15, H. 5. pp. 257-264. 1992Jung, T. A. and Moser, A. and HUG, H. J. and Brodbeck, D. and Hofer, R. and Hidber, H. R. and Schwarz, U. D.. (1992) The atomic force microscope used as a powerful tool for machining surfaces. ULTRAMICROSCOPY, 42-44 (2). pp. 1446-1451. |
