edoc

Items where Author is "Gysin, U."

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Date | Item Type | Refereed
Jump to: 2016 | 2015 | 2011 | 2009 | 2006 | 2005 | 2001 | 2000
Number of items: 13.

2016

Gysin, U. and Meyer, E. and Glatzel, Th and Guenzburger, G. and Rossmann, H. R. and Jung, T. A. and Reshanov, S. and Schoener, A. and Bartolf, H.. (2016) Dopant imaging of power semiconductor device cross sections. Microelectronic Engineering, 160. pp. 18-21.

Rossmann, H. R. and Gysin, U. and Bubendorf, A. and Glatzel, T. and Reshanov, S. A. and Zhang, A. and Schoner, A. and Jung, T. A. and Meyer, E. and Bartolf, H.. (2016) Junction Barrier Schottky (JBS) Rectifier Interface Engineering Facilitated by Two-Dimensional (2D) Dopant Imaging. Materials Science Forum, 858. pp. 497-500.

Eren, B. and Gysin, U. and Marot, L. and Glatzel, Th and Steiner, R. and Meyer, E.. (2016) Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy. Applied Physics Letters, 108 (4). 041602.

2015

Bartolf, H. and Gysin, U. and Rossmann, H. R. and Bubendorf, A. and Glatzel, T. and Jung, T. A. and Meyer, E. and Zimmermann, M. and Reshanov, S. and Schöner, A.. (2015) Development of power semiconductors by quantitative nanoscale dopant imaging. In: 2015 IEEE 27th International Symposium on Power Semiconductor Devices IC`s (ISPSD). pp. 281-284.

Bartolf, H. and Gysin, U. and Glatzel, T. and Rossmann, H. R. and Jung, T. A. and Reshanov, S. A. and Schöner, A. and Meyer, E.. (2015) Improving the Design of the Shield for the Electric Field in SiC-Based Schottky-Rectifiers and Ion-Implantation Cascades by SPM Dopant-Imaging. Microelectronic Engineering, 148. pp. 1-4.

2011

Gysin, U. and Rast, S. and Kisiel, M. and Werle, C. and Meyer, E.. (2011) Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry. Review of scientific instruments, Vol. 82, H. 2 , 023705.

2009

Rast, S. and Gysin, U. and Meyer, E.. (2009) Phase noise induced due to amplitude fluctuations in dynamic force microscopy. Physical Review B, Vol. 79, H. 5 , 054106, 6 S..

2006

Rast, S. and Gysin, U. and Ruff, P. and Gerber, C. and Meyer, E. and Lee, D. W.. (2006) Force microscopy experiments with ultrasensitive cantilevers. Nanotechnology, Vol. 17, H. 7, Sp. Iss. SI , S189-S194.

2005

Lee, D. W. and Kang, J. H. and Gysin, U. and Rast, S. and Meyer, E. and Despont, M. and Gerber, C.. (2005) Fabrication and evaluation of single-crystal silicon cantilevers with ultra-low spring constants. Journal of micromechanics and microengineering, Vol. 15, H. 11. pp. 2179-2183.

2001

Meyer, E. and Bennewitz, R. and Pfeiffer, O. and Barwich, V. and Guggisberg, M. and Schar, S. and Bammerlin, M. and Loppacher, C. and Gysin, U. and Wattinger, C. and Baratoff, A.. (2001) Dissipation mechanisms studied by dynamic force microscopies. In: Fundamentals of tribology and bridging the gap between the macro- and micro-nanoscales (NATO science series II, Mathematics, physics and chemistry, Vol. 10). Dordrecht, pp. 67-81.

2000

Rast, S. and Wattinger, C. and Gysin, U. and Meyer, E.. (2000) Dynamics of damped cantilevers. Review of scientific instruments, Vol. 71, H. 7. pp. 2772-2775.

Rast, S. and Wattinger, C. and Gysin, U. and Meyer, E.. (2000) The noise of cantilevers. Nanotechnology, Vol. 11, H. 3. pp. 169-172.

Pfeiffer, O. and Loppacher, C. and Wattinger, C. and Bammerlin, M. and Gysin, U. and Guggisberg, M. and Rast, S. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (2000) Using higher flexural modes in non-contact force microscopy. Applied surface science, Vol. 157, H. 4. pp. 337-342.

This list was generated on Fri Mar 29 06:53:59 2024 CET.