Items where Author is "Glatzel, Th"
Number of items: 5. 2016Gysin, U. and Meyer, E. and Glatzel, Th and Guenzburger, G. and Rossmann, H. R. and Jung, T. A. and Reshanov, S. and Schoener, A. and Bartolf, H.. (2016) Dopant imaging of power semiconductor device cross sections. Microelectronic Engineering, 160. pp. 18-21. Eren, B. and Gysin, U. and Marot, L. and Glatzel, Th and Steiner, R. and Meyer, E.. (2016) Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy. Applied Physics Letters, 108 (4). 041602. 2014Eren, B. and Marot, L. and Guenzburger, G. and Renault, P.-O. and Glatzel, Th and Steiner, R. and Meyer, E.. (2014) Hydrogen-induced buckling of gold films. Journal of physics. D, Applied physics, 47 (2). 025302. 2012Koch, S. and Langer, M. and Kawai, S. and Meyer, E. and Glatzel, Th. (2012) Contrast inversion of the h-BN nanomesh investigated by nc-AFM and Kelvin probe force microscopy. Journal of physics. Condensed matter, Vol. 24, H. 31 , 314212. 2009Glatzel, Th and Zimmerli, L. and Koch, S. and Such, B. and Kawai, S. and Meyer, E.. (2009) Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals. Nanotechnology, Vol. 20, H. 26 , 264016, 7 S.. |
