Items where Author is "Bonner, T."
Jump to: 1994 Number of items: 3. 1994Overney, R. M. and Bonner, T. and Meyer, E. and Reutschi, M. and Luthi, R. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Fujihara, M. and Takano, H.. (1994) Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 1973-1976. Luthi, R. and Meyer, E. and Howald, L. and Haefke, H. and Anselmetti, D. and Dreier, M. and Ruetsche, M. and Bonner, T. and Overney, R. M. and Frommer, J. and Guntherodt, H. J.. (1994) Progress in noncontract dynamic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 1673-1676. Meyer, E. and Howald, L. and Luthi, R. and Haefke, H. and Ruetschi, M. and Bonner, T. and Overney, R. and Frommer, J. and Hofer, R. and Guntheroidt, H. J.. (1994) Scanning probe microscopy on the surface of Si(111). Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2060-2063. |
