Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy
Date Issued
1999-01-01
Author(s)
Eng, LM
Bammerlin, M
Loppacher, C
Guggisberg, M
Bennewitz, R
Luthi, R
Huser, T
Heinzelmann, H
Guntherodt, HJ
DOI
10.1080/00150199908014811
Abstract
Domain writing and reading on the nanometer scale is addressed with scanning force microscopy (SFM) Compared to other scanning probe methods, SFM provides broad possibilities for the on-line data controlling. i.e. three-dimensional mapping of polarisation distribution, differentiation between polarisation and topography, nanoscale domain switching of domains with a 60 nm diameter, recording of nanoscale hysteresis loops, phase transition mapping. domain wall imaging with 9 nm resolution, atomic resolution of ferroelectric surfaces, etc. All these issues are reported in this paper. The challenging result of such a concerted investigation is the possibility of using SFM for nanoscale domain writing and reading with nanometer resolution. Fig. 1 illustrates such an example where line shaped c - domains are purposely written into a ferroelectric Barium-Titanate single crystal with a 400 nm line-width. With this figure we highly appreciate and honour the work of Bob Newnham passing our best nano-wishes for his future.