Howald, L. and Luthi, R. and Meyer, E. and Guthner, P. and Guntherodt, H. J.. (1994) Scanning force microscopy on the Si(111)7×7 surface reconstruction. Zeitschrift für Physik. B, Condensed matter, Vol. 93, H. 3. pp. 267-268.
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Official URL: http://edoc.unibas.ch/dok/A5839499
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Abstract
Scanning force microscopy images of the Si(111)7 x 7 surface reconstruction are presented which are taken in the contact mode in ultrahigh vacuum. Topographic and lateral force data are acquired simultaneously. A special treatment of the sensing tip with PTFE helps to overcome the strong adhesion and wear effects that normally occur on this particular surface.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Springer |
| ISSN: | 0722-3277 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:42 |
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