Bammerlin, M. and Luthi, R. and Meyer, E. and Baratoff, A. and Lu, J. and Guggisberg, M. and Loppacher, C. and Gerber, C. and Guntherodt, H. J.. (1998) Dynamic SFM with true atomic resolution on alkali halide surfaces. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S293-S294.
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Official URL: http://edoc.unibas.ch/dok/A5839459
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Abstract
Large-amplitude dynamic force microscopy is used to study alkali halide surfaces. The 001 cleavage faces of NaF, RbBr, LiF, KI and NaCl could be atomically resolved with excellent stability. In all cases the observed lattice periods correspond to the bulk lattice of equally charged ions. The resonance frequency shift and the atomic corrugation amplitude tend to increase after successive tip crashes. This behaviour is explained by analogy with scanning tunnelling microscopy. In addition, the mean atomic corrugation is found to be comparable to the difference between the anion and cation ionic radii.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Springer-Verlag |
| ISSN: | 1432-0630 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:45 |
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