Switchable cantilever for a time-of-flight scanning force microscope

We have developed a cantilever device for applying a time-of-flight scanning force microscope (TOF-SFM) system. The cantilever device consists of a switchable cantilever with an integrated bimorph actuator, an integrated extraction electrode to minimize the ion extraction voltage, and an interlocking structure for precise tip-EE alignment. The TOF-SFM with the cantilever device allows quasisimultaneous topographical and chemical analyses of solid surfaces to be performed in the same way as with the conventional scanning probe technique. The switching properties of the bimorph actuator are demonstrated for use in two operating systems. Field emission measurements and a TOF analysis of a Pt-coated tip are conducted with the TOF-SFM.