Robust Single-Shot Spin Measurement with 99.5% Fidelity in a Quantum Dot Array

Nakajima, Takashi and Delbecq, Matthieu R. and Otsuka, Tomohiro and Stano, Peter and Amaha, Shinichi and Yoneda, Jun and Noiri, Akito and Kawasaki, Kento and Takeda, Kenta and Allison, Giles and Ludwig, Arne and Wieck, Andreas D. and Loss, Daniel and Tarucha, Seigo. (2017) Robust Single-Shot Spin Measurement with 99.5% Fidelity in a Quantum Dot Array. Physical review letters, 119 (1). 017701.

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Official URL: https://edoc.unibas.ch/75409/

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We demonstrate a new method for projective single-shot measurement of two electron spin states (singlet versus triplet) in an array of gate-defined lateral quantum dots in GaAs. The measurement has very high fidelity and is robust with respect to electric and magnetic fluctuations in the environment. It exploits a long-lived metastable charge state, which increases both the contrast and the duration of the charge signal distinguishing the two measurement outcomes. This method allows us to evaluate the charge measurement error and the spin-to-charge conversion error separately. We specify conditions under which this method can be used, and project its general applicability to scalable quantum dot arrays in GaAs or silicon.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Theoretische Physik Mesoscopics (Loss)
UniBasel Contributors:Loss, Daniel
Item Type:Article, refereed
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:29 Mar 2020 18:00
Deposited On:29 Mar 2020 18:00

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