Sadewasser, Sascha and Glatzel, Thilo. (2018) Kelvin Probe Force Microscopy - From Single Charge Detection to Device Characterization. Springer Series in Surface Sciences book series, 65. Cham.
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Official URL: https://edoc.unibas.ch/68810/
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| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Glatzel, Thilo |
| Item Type: | Book |
| Book Subtype: | Authored Book |
| Publisher: | Springer International Publishing |
| ISBN: | 978-3-319-75686-8 |
| e-ISBN: | 978-3-319-75687-5 |
| ISSN: | 0931-5195 |
| e-ISSN: | 2198-4743 |
| Number of Pages: | 521 |
| Note: | Publication type according to Uni Basel Research Database: Authored book |
| Identification Number: | |
| Last Modified: | 09 Oct 2019 15:38 |
| Deposited On: | 09 Oct 2019 15:38 |
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