edoc

Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN

Praena, J. and Ferrer, F. J. and Vollenberg, W. and Sabate-Gilarte, M. and Fernandez, B. and Garcia-Lopez, J. and Porras, I. and Quesada, J. M. and Altstadt, S. and Andrzejewski, J. and Audouin, L. and Becares, V. and Barbagallo, M. and Becvar, F. and Belloni, F. and Berthoumieux, E. and Billowes, J. and Boccone, V. and Bosnar, D. and Brugger, M. and Calvino, F. and Calviani, M. and Cano-Ott, D. and Carrapico, C. and Cerutti, F. and Chiaveri, E. and Chin, M. and Colonna, N. and Cortes, G. and Cortes-Giraldo, M. A. and Diakaki, M. and Dietz, M. and Domingo-Pardo, C. and Dressler, R. and Duran, I. and Eleftheriadis, C. and Ferrari, A. and Fraval, K. and Furman, V. and Goebel, K. and Gomez-Hornillos, M. B. and Ganesan, S. and Garcia, A. R. and Giubrone, G. and Goncalves, I. F. and Gonzalez-Romero, E. and Goverdovski, A. and Griesmayer, E. and Guerrero, C. and Gunsing, F. and Heftrich, T. and Hernandez-Prieto, A. and Heyse, J. and Jenkins, D. G. and Jericha, E. and Kaeppeler, F. and Kadi, Y. and Karadimos, D. and Katabuchi, T. and Ketlerov, V. and Khryachkov, V. and Kivel, N. and Koehler, P. and Kokkoris, M. and Kroll, J. and Krticka, M. and Lampoudis, C. and Langer, C. and Leal-Cidoncha, E. and Lederer, C. and Leeb, H. and Leong, L. S. and Lerendegui-Marco, J. and Losito, R. and Mallick, A. and Manousos, A. and Marganiec, J. and Martinez, T. and Massimi, C. and Mastinu, P. and Mastromarco, M. and Mendoza, E. and Mengoni, A. and Milazzo, P. M. and Mingrone, F. and Mirea, M. and Mondelaers, W. and Paradela, C. and Pavlik, A. and Perkowski, J. and Plompen, A. J. M. and Rauscher, T. and Reifarth, R. and Riego-Perez, A. and Robles, M. and Rubbia, C. and Ryan, J. A. and Sarmento, R. and Saxena, A. and Schillebeeckx, P. and Schmidt, S. and Schumann, D. and Sedyshev, P. and Tagliente, G. and Tain, J. L. and Tarifeno-Saldivia, A. and Tarrio, D. and Tassan-Got, L. and Tsinganis, A. and Valenta, S. and Vannini, G. and Variale, V. and Vaz, P. and Ventura, A. and Vermeulen, M. J. and Vlachoudis, V. and Vlastou, R. and Wallner, A. and Ware, T. and Weigand, M. and Weiss, C. and Wright, T. and Zugec, P.. (2018) Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 890. pp. 142-147.

[img]
Preview
PDF - Published Version
Available under License CC BY (Attribution).

1398Kb

Official URL: https://edoc.unibas.ch/64220/

Downloads: Statistics Overview

Abstract

Thin S-33 samples for the study of the S-33(n,alpha)Si-30 cross-section at the n_TOF facility at CERN were made by thermal evaporation of S-33 powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of S-33 has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Theoretische Physik Astrophysik (Thielemann)
UniBasel Contributors:Rauscher, Thomas
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:Elsevier
ISSN:0168-9002
e-ISSN:1872-9576
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
Identification Number:
Last Modified:28 May 2018 06:57
Deposited On:28 May 2018 06:33

Repository Staff Only: item control page