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Contactless Microwave Characterization of Encapsulated Graphene p-n Junctions

Ranjan, Vishal and Zihlmann, Simon and Makk, Péter and Watanabe, Kenji and Taniguchi, Takashi and Schönenberger, Christian . (2017) Contactless Microwave Characterization of Encapsulated Graphene p-n Junctions. Phys. Rev. Applied, 7 (5). 054015.

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Official URL: http://edoc.unibas.ch/58124/

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Abstract

Accessing intrinsic properties of a graphene device can be hindered by the influence of contact electrodes. Here, we capacitively couple graphene devices to superconducting resonant circuits and observe clear changes in the resonance-frequency and -widths originating from the internal charge dynamics of graphene. This allows us to extract the density of states and charge relaxation resistance in graphene p-n junctions without the need of electrical contacts. The presented characterizations pave a fast, sensitive and non-invasive measurement of graphene nanocircuits.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Experimentalphysik Nanoelektronik (Schönenberger)
UniBasel Contributors:Schönenberger, Christian and Zihlmann, Simon and Makk, Peter
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Physical Society
ISSN:2331-7019
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
Identification Number:
Last Modified:28 Dec 2017 09:39
Deposited On:28 Dec 2017 09:39

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