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Atomic Force Microscope

Binnig, G. and Quate, C. F. and Gerber, C.. (1986) Atomic Force Microscope. Physical Review Letters, 56 (9). pp. 930-933.

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Official URL: http://edoc.unibas.ch/52112/

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Abstract

The scanning tunneling microscope is proposed as a method to measure forces as small as 10−18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 ÅA and a vertical resolution less than 1 Å.
Faculties and Departments:05 Faculty of Science
UniBasel Contributors:Gerber, Christoph
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:American Physical Society
ISSN:0031-9007
e-ISSN:1079-7114
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
Identification Number:
Last Modified:24 Aug 2017 10:13
Deposited On:24 Aug 2017 10:13

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