Low-dose aberration corrected cryo-electron microscopy of organic specimens

Evans, James E. and Hetherington, Crispin and Kirkland, Angus and Chang, Lan-Yun and Stahlberg, Henning and Browning, Nigel. (2008) Low-dose aberration corrected cryo-electron microscopy of organic specimens. Ultramicroscopy, Vol. 108, H. 12. pp. 1636-1644.

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Official URL: http://edoc.unibas.ch/dok/A5842547

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Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C(s)-correction can provide a significant improvement in resolution (to less than 0.16nm) for direct imaging of organic samples.
Faculties and Departments:05 Faculty of Science > Departement Biozentrum > Former Organization Units Biozentrum > Structural Biology (Stahlberg)
UniBasel Contributors:Stahlberg, Henning
Item Type:Article, refereed
Article Subtype:Research Article
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:08 Jun 2012 06:56
Deposited On:08 Jun 2012 06:47

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