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Local regression based statistical model fitting

Amberg, Matthias and Lüthi, Marcel and Vetter, Thomas. (2010) Local regression based statistical model fitting. In: Pattern Recognition : 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Berlin, pp. 452-461.

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Official URL: http://edoc.unibas.ch/dok/A5842378

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Faculties and Departments:05 Faculty of Science > Departement Mathematik und Informatik > Informatik > Computergraphik Bilderkennung (Vetter)
UniBasel Contributors:Vetter, Thomas and Lüthi, Marcel and Amberg, Matthias
Item Type:Conference or Workshop Item, refereed
Conference or workshop item Subtype:Conference Paper
Bibsysno:Link to catalogue
Publisher:Springer
ISBN:978-3-642-15986-2 ; 978-3-642-15985-5
Series Name:Lecture Notes in Computer Science
Issue Number:6376
Note:Publication type according to Uni Basel Research Database: Conference paper
Language:English
Identification Number:
Last Modified:31 Dec 2015 10:48
Deposited On:08 Jun 2012 06:31

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