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Items where Author is "Walheim, Stefan"

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Group by: Date | Item Type | Refereed
Jump to: 2018 | 2010
Number of items: 2.

2018

Bubendorf, Alexandre and Walheim, Stefan and Schimmel, Thomas and Meyer, Ernst. (2018) A robust AFM-based method for locally measuring the elasticity of samples. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 9. pp. 1-10.

2010

Barczewski, Matthias and Walheim, Stefan and Heiler, Tobias and Błaszczyk, Alfred and Mayor, Marcel and Schimmel, Thomas. (2010) High aspect ratio constructive nanolithography with a photo-fimerizable molecule. Langmuir, 26 (5). pp. 3623-3628.

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