Items where Author is "Howald, L."

1997

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M.. (1997) Instrumental aspects and contrast mechanisms of friction force microscopy. In: Micro/nanotribology and its applications. Dordrecht [etc.], pp. 193-215.

Luthi, R. and Meyer, E. and Bammerlin, M. and Baratoff, A. and Howald, L. and Gerber, C. and Guntherodt, H. J.. (1997) Ultrahigh vacuum atomic force microscopy : true atomic resolution. Surface review and letters, Vol. 4, H. 5. pp. 1025-1029.

1996

Luthi, R. and Meyer, E. and Bammerlin, M. and Baratoff, A. and Lehmann, T. and Howald, L. and Gerber, C. and Guntherodt, H. J.. (1996) Atomic resolution in dynamic force microscopy across steps on Si(111)7 x 7. Zeitschrift für Physik. B, Condensed matter, Vol. 100, H. 2. pp. 165-167.

Meyer, E. and Luthi, R. and Howald, L. and Gutmannsbauer, W. and Haefke, H. and Guntherodt, H. J.. (1996) Friction force microscopy on well defined surfaces. Nanotechnology, Vol. 7, H. 4. pp. 340-344.

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M. and Guggisberg, M. and Guntherodt, H. J. and Scandella, L. and Gobrecht, J. and Schumacher, A. and Prins, R.. (1996) Friction force spectroscopy. In: Physics of sliding friction. Dordrecht [etc.], pp. 349-367.

Scandella, L. and Meyer, E. and Howald, L. and Luthi, R. and Guggisberg, M. and Gobrecht, J. and Guntherodt, H. J.. (1996) Friction forces on hydrogen passivated (110) silicon and silicon dioxide studied by scanning force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. pp. 1255-1258.

Luthi, R. and Meyer, E. and Bammerlin, M. and Howald, L. and Haefke, H. and Lehmann, T. and Loppacher, C. and Guntherodt, H. J. and Gyalog, T. and Thomas, H.. (1996) Friction on the atomic scale : an ultrahigh vacuum atomic force microscopy study on ionic crystals. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. pp. 1280-1284.

Schumacher, A. and Kruse, N. and Prins, R. and Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J. and Scandella, L.. (1996) Influence of humidity on friction measurements of supported MoS2 single layers. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. pp. 1264-1267.

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M. and Guggisberg, M. and Guntherodt, H. J.. (1996) Site-specific friction force spectroscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. pp. 1285-1288.

1995

Howald, L. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1995) Atomic-force microscopy on the Si(111) 7x7 surface. Physical Review B, Vol. 51, H. 8. pp. 5484-5487.

Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J.. (1995) Friction force microscopy. In: Forces in scanning probe methods. Dordrecht [etc.], pp. 285-306.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J. and Gyalog, T. and Thomas, H.. (1995) Friction force microscopy in ultrahigh vacuum : an atomic-scale study. Abstracts of papers / American Chemical Society, Vol. 209, H. Part 1 , S. 143-COLL.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J.. (1995) Friction force microscopy in ultrahigh-vacuum - study on C-60 thin-films deposited on NaCl. Abstracts of papers / American Chemical Society, Vol. 209, H. Part 1 , S. 216-COLL.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Gutmannsbauer, W. and Guggisberg, M. and Bammerlin, M. and Guntherodt, H. J.. (1995) Nanotribology : an UHV-SFM study on thin-films of C60 and AgBr. Surface science, Vol. 338, H. 1-3. pp. 247-260.

1994

Overney, R. M. and Bonner, T. and Meyer, E. and Reutschi, M. and Luthi, R. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Fujihara, M. and Takano, H.. (1994) Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 1973-1976.

Howald, L. and Luthi, R. and Meyer, E. and Gerth, G. and Haefke, H. G. and Overney, R. and Guntherodt, H. J.. (1994) Friction force microscopy on clean surfaces of NaCl, NaF, and AgBr. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2227-2230.

Luthi, R. and Haefke, H. and Meyer, E. and Howald, L. and Lang, H. P. and Gerth, G. and Guntherodt, H. J.. (1994) Frictional and atomic-scale study of C60 thin films by scanning force microscopy. Zeitschrift für Physik. B, Condensed matter, Vol. 95, H. 1. pp. 1-3.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J.. (1994) Nanosled experiments - determination of dissipation and cohesive energies of C-60 with UHV-SFM. Helvetica physica acta, Vol. 67, H. 7. pp. 755-756.

Luthi, R. and Meyer, E. and Howald, L. and Haefke, H. and Anselmetti, D. and Dreier, M. and Ruetsche, M. and Bonner, T. and Overney, R. M. and Frommer, J. and Guntherodt, H. J.. (1994) Progress in noncontract dynamic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 1673-1676.

Howald, L. and Luthi, R. and Meyer, E. and Guthner, P. and Guntherodt, H. J.. (1994) Scanning force microscopy on the Si(111)7×7 surface reconstruction. Zeitschrift für Physik. B, Condensed matter, Vol. 93, H. 3. pp. 267-268.

Meyer, E. and Howald, L. and Luthi, R. and Haefke, H. and Ruetschi, M. and Bonner, T. and Overney, R. and Frommer, J. and Hofer, R. and Guntheroidt, H. J.. (1994) Scanning probe microscopy on the surface of Si(111). Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2060-2063.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Gutmannsbauer, W. and Guntherodt, H. J.. (1994) Sled-type motion on the nanometer scale : determination of dissipation and cohesive energies of C-60. Science, Vol. 266, H. 5193. pp. 1979-1981.

Luthi, R. and Haefke, H. and Gutmannsbauer, W. and Meyer, E. and Howald, L. and Guntherodt, H. J.. (1994) Statics and dynamics of ferroelectric domains studied with scanning force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 4. pp. 2451-2455.

Scandella, L. and Schumacher, A. and Kruse, N. and Prins, R. and Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J.. (1994) Tribology of ultra-thin MoS2 platelets on mica : studies by scanning force microscopy. Thin Solid Films, Vol. 240, H. 1-2. pp. 101-104.

Howald, L. and Haefke, H. and Luthi, R. and Meyer, E. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1994) Ultrahigh-vacuum scanning force microscopy : atomic-scale resolution at monatomic cleavage steps. Physical Review B, Vol. 49, H. 8. pp. 5651-5656.

1993

Luthi, R. and Haefke, H. and Meyer, K. P. and Meyer, E. and Howald, L. and Ruetschi, M. and Overney, R. M. and Guntherodt, H. J.. (1993) Investigation on ferroelectric domains and domain-walls with scanning force microscopy. Helvetica physica acta, Vol. 66, H. 4. pp. 415-416.

Howald, L. and Meyer, E. and Luthi, R. and Haefke, H. and Overney, R. and Rudin, H. and Guntherodt, H. J.. (1993) Multifunctional probe microscope for facile operation in ultrahigh-vacuum. Applied physics letters, Vol. 63, H. 1. pp. 117-119.

Dammer, U. and Anselmetti, D. and Dreier, M. and Frommer, J. and Funfschilling, J. and Gerth, G. and Guntherodt, H. J. and Haefke, H. and Hidber, H. R. and Howald, L. and HUG, H. J. and Jung, T. H. and Lang, H. P. and Luthi, R. and Meyer, E. and Moser, A. and Parashikov, I. and Reimann, P. and Richmond, T. and Ruetschi, M. and Rudin, H. and Schwarz, U. D. and Staufer, U. and SUM, R.. (1993) Scanning probe microscopy for industrial applications : selected examples. Scanning, Vol. 15, H. 5. pp. 257-264.

Luthi, R. and Haefke, H. and Meyer, K. P. and Meyer, E. and Howald, L. and Guntherodt, H. J.. (1993) Surface and domain structures of ferroelectric crystals studied with scanning force microscopy. Journal of applied physics, Vol. 74, H. 12. pp. 7461-7471.

1992

Haefke, H. and Meyer, E. and Howald, L. and Schwarz, U. and Gerth, G. and Krohn, M.. (1992) Atomic surface and lattice structures of AgBr thin-films. Ultramicroscopy, Vol. 42, Part A. pp. 290-297.

Howald, L. and Luthi, R. and Meyer, E. and Haefke, H. and Overney, R. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1992) Bidirectional force microscope for surface-analysis in ultrahigh-vacuum. Helvetica physica acta, Vol. 65, H. 6. pp. 868-869.

Meyer, E. and Overney, R. and Brodbeck, D. and Howald, L. and Luthi, R. and Frommer, J. and Guntherodt, H. J.. (1992) Friction and wear of Langmuir-Blodgett films observed by friction force microscopy. Physical review letters, Vol. 69, H. 12. pp. 1777-1780.

Meyer, E. and Overney, R. and Luthi, R. and Brodbeck, D. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Wolter, O. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction forc emicroscopy of mixed Langmuir-Blodgett films. Thin Solid Films, Vol. 220, H. 1-2. pp. 132-137.

Overney, R. M. and Meyer, E. and Frommer, J. and Brodbeck, D. and Luthi, R. and Howald, L. and Guntherodt, H. J. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction measurements on phase-separated thin films with a modified atomic force microscope. Nature, Vol. 359, H. 6391. pp. 133-135.

Luthi, R. and Overney, R. M. and Meyer, E. and Howald, L. and Brodbeck, D. and Guntherodt, H. J.. (1992) Measurements on Langmuir-Blodgett-films by friction force microscopy. Helvetica physica acta, Vol. 65, H. 6. pp. 866-867.

Haefke, H. and Burgler, D. and Gerth, G. and Howald, L. and Meyer, E. and Schwarz, U. D. and Steiger, R. and Tarrach, G. and Wiesendanger, R.. (1992) Microstructures and nanostructures on silver-halide surfaces 1 : preparation and characterization of AgBr samples. Helvetica physica acta, Vol. 65, H. 6. pp. 872-873.

Overney, R. M. and Howald, L. and Frommer, J. and Meyer, E. and Brodbeck, D. and Guntherodt, H. J.. (1992) Molecular surface structure of organic crystals observed by atomic force microscopy. Ultramicroscopy, Vol. 42, Part B. pp. 983-988.

Brodbeck, D. and Howald, L. and Luthi, R. and Meyer, E. and Overney, R.. (1992) Scan control and data acquisition for bidirectional force microscopy. Ultramicroscopy, Vol. 42, Part B. pp. 1580-1584.

Meyer, E. and Howald, L. and Overney, R. and Brodbeck, D. and Luthi, R. and Haefke, H. and Frommer, J. and Guntherodt, H. J.. (1992) Structure and dynamics of solid surfaces observed by atomic force microscopy. Ultramicroscopy, Vol. 42, Part A. pp. 274-280.

1991

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Overney, R. and Howald, L. and HUG, H. and Jung, T. and Hidber, H. R. and Guntherodt, H. J.. (1991) Atomic resolution on the surface of LiF(100) by atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 9, H. 2, Part 2. pp. 1329-1332.

Overney, R. M. and Howald, L. and Frommer, J. and Meyer, E. and Guntherodt, H. J.. (1991) Molecular surface structure of tetracene mapped by the atomic force microscope. Journal of Chemical Physics, 94 (12). pp. 8441-8443.

Meyer, E. and Howald, L. and Overney, R. M. and Heinzelmann, H. and Frommer, J. and Guntherodt, H. J. and Wagner, T. and Schier, H. and Roth, S.. (1991) Molecular-resolution images of Langmuir-Blodgett films using atomic force microscopy. Nature, Vol. 349, H. 6308. pp. 398-400.

1990

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Howald, L. and Guntherodt, H. J.. (1990) Atomic force microscopy : high-resolution and contrast mechanism. Helvetica physica acta, Vol. 63, H. 6. pp. 793-794.