Items where Author is "Hofer, R."

1994

Meyer, E. and Howald, L. and Luthi, R. and Haefke, H. and Ruetschi, M. and Bonner, T. and Overney, R. and Frommer, J. and Hofer, R. and Guntheroidt, H. J.. (1994) Scanning probe microscopy on the surface of Si(111). Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2060-2063.

1992

Jung, T. A. and Moser, A. and HUG, H. J. and Brodbeck, D. and Hofer, R. and Hidber, H. R. and Schwarz, U. D.. (1992) The atomic force microscope used as a powerful tool for machining surfaces. ULTRAMICROSCOPY, 42-44 (2). pp. 1446-1451.