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Items where Author is "Akiyama, T."

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Jump to: 2007 | 2006 | 2005 | 2004 | 2003
Number of items: 7.

2007

Staufer, U. and Akiyama, T. and Gullo, M. R. and Han, A. and Imer, R. and de Rooij, N. F. and Aebi, U. and Engel, A. and Frederix, P. L. T. M. and Stolz, M. and Friederich, N. F. and Wirz, D.. (2007) Micro- and Nanosystems for Biology and Medicine. Microelectronic engineering, Vol. 84. pp. 1681-1684.

2006

Gullo, M. R. and Frederix, P. L. and Akiyama, T. and Engel, A. and deRooij, N. F. and Staufer, U.. (2006) Characterization of microfabricated probes for combined atomic force and high-resolution scanning electrochemical microscopy. Analytical chemistry, Vol. 78, no. 15. pp. 5436-5442.

Imer, R. and Akiyama, T. and De Rooij, N. F. and Stolz, M. and Aebi, U. and Friederich, N. F. and Koenig, U. and Wirz, D. and Daniels, A. U. and Staufer, U.. (2006) Development of an Atomic Force Microscope for Arthoscopic Knee Cartilage Inspection. Japanese journal of applied physics. Part 1, Regular papers, short notes & review papers, Vol. 45. pp. 2319-2323.

2005

Frederix, Pltm and Gullo, M. R. and Akiyama, T. and Tonin, A. and de Rooij, N. F. and Staufer, U. and Engel, A.. (2005) Assessment of insulated conductive cantilevers for biology and electrochemistry. Nanotechnology, Vol. 16. pp. 997-1005.

2004

Akiyama, T. and Gullo, M. R. and De Rooij, N. F. and Staufer, U. and Tonin, A. and Frederix, P. L. T. M. and Engel, A.. (2004) Development of Insulated Conductive Probes with Platinum-Silicide Tips for AFM in Cell Biology. Japanese journal of applied physics. Part 1, Regular papers, short notes & review papers, Vol. 43. pp. 3865-3867.

2003

Frederix, P. L. T. M. and Akiyama, T. and Staufer, U. and Gerber, C. and Fotiadis, D. and Muller, D. J. and Engel, A.. (2003) Atomic force bio-analytics. Current opinion in chemical biology, Vol. 7, H. 5. pp. 641-647.

Akiyama, T. and Staufer, U. and de Rooij, N. F. and Frederix, P. and Engel, A.. (2003) Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy. Review of scientific instruments, Vol. 74, H. 1. pp. 112-117.

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