Items where contributor is "Riedel, Max"

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Ockeloen, Caspar F. and Schmied, Roman and Riedel, Max F. and Treutlein, Philipp. (2013) Quantum Metrology with a Scanning Probe Atom Interferometer. Physical review letters, 111 (14). p. 143001.

Böhi, Pascal and Riedel, Max F. and Treutlein, Philipp. (2011) Cold atoms image microwave fields. SPS Communications, Vol. 33. p. 10.

Riedel, Max F. and Böhi, Pascal and Li, Yun and Hänsch, Theodor W. and Sinatra, Alice and Treutlein, Philipp. (2010) Atom-chip-based generation of entanglement for quantum metrology. Nature, 464 (7292). pp. 1170-1173.

Böhi, Pascal and Riedel, Max F. and Hänsch, Theodor W. and Treutlein, Philipp. (2010) Imaging of microwave fields using ultracold atoms. Applied physics letters, 97 (5). 051101.