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Characterization of microfabricated probes for combined atomic force and high-resolution scanning electrochemical microscopy

Gullo, M. R. and Frederix, P. L. and Akiyama, T. and Engel, A. and deRooij, N. F. and Staufer, U.. (2006) Characterization of microfabricated probes for combined atomic force and high-resolution scanning electrochemical microscopy. Analytical chemistry, Vol. 78, no. 15. S. 5436-5442.

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Official URL: http://edoc.unibas.ch/dok/A5262425

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Abstract

A combined atomic force and scanning electrochemical microscope probe is presented. The probe is electrically insulated except at the very apex of the tip, which has a radius of curvature in the range of 10-15 nm. Steady-state cyclic voltammetry measurements for the reduction of Ru(NH3)6Cl3 and feedback experiments showed a distinct and reproducible response of the electrode. These experimental results agreed with finite element simulations for the corresponding diffusion process. Sequentially topographical and electrochemical studies of Pt lines deposited onto Si3N4 and spaced 100 nm apart (edge to edge) showed a lateral electrochemical resolution of 10 nm.
Faculties and Departments:05 Faculty of Science > Departement Biozentrum > Former Organization Units Biozentrum > Structural Biology (Engel)
UniBasel Contributors:Engel, Andreas H
Item Type:Article, refereed
Bibsysno:Link to catalogue
ISSN:0003-2700
Note:Publication type according to Uni Basel Research Database: Journal article
Last Modified:22 Mar 2012 14:23
Deposited On:22 Mar 2012 13:31

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