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Investigation of the dominant 1/f Noise Source in Silicon Nanowire Sensors

Bedner, K. and Guzenko, V. A. and Tarasov, A. and Wipf, M. and Stoop, L. and Rigante, S. and Brunner, J. and Fu, W. and David, C. and Calame, M. and Gobrecht, J. and Schönenberger, C.. (2014) Investigation of the dominant 1/f Noise Source in Silicon Nanowire Sensors. Sensors and actuators. B, Chemical, Vol. 191 , S. 270– 275.

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Official URL: http://edoc.unibas.ch/dok/A6338954

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Experimentalphysik Nanoelektronik (Schönenberger)
UniBasel Contributors:Schönenberger, Christian and Bedner, Kristine and Tarasov, Alexey and Wipf, Mathias and Stoop, Ralph and Brunner, Jan and Fu, Wangyang and Calame, Michel
Item Type:Article, refereed
Bibsysno:Link to catalogue
Publisher:Elsevier
ISSN:0925-4005
Note:Publication type according to Uni Basel Research Database: Journal article
Last Modified:06 Feb 2015 09:59
Deposited On:06 Feb 2015 09:59

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